Mostra 1 - 11 risultati di 11 ricerca 'Stover, John', tempo di risposta: 0,03s Raffina i risultati
  1. 1
    Optical Scattering: Measurement and Analysis, 2nd Ed
    di Stover, John C.
    Pubblicazione 2009
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on SPIE Digital Library
    Off-campus access
    Elettronico eBook
  2. 2
    Optical Scattering: Measurement and Analysis, 3rd Ed
    di Stover, John C.
    Pubblicazione 2012
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on SPIE Digital Library
    Off-campus access
    Elettronico eBook
  3. 3
    Optical Scattering: Measurement and Analysis, 2nd Ed
    di Stover, John C.
    On-Campus Access Only (IP based access)
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  4. 4
    Optical Scattering: Measurement and Analysis, 3rd Ed
    di Stover, John C.
    On-Campus Access Only (IP based access)
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  5. 5
    Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  6. 6
    Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  7. 7
    Optical Scattering: Applications, Measurement, and Theory II
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  8. 8
    Optical Scatter: Applications, Measurement, and Theory
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  9. 9
    Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  10. 10
    Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
  11. 11
    Scatter from Optical Components
    On-Campus Access Only (IP based access)
    Altri autori: “...Stover, John...”
    Full text available on Research4Life (SPIE Digital Library)
    Elettronico Libro
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