Rezultaty 1 - 11 Rezultaty od 11 Dla wyszukiwania 'Stover, John', Czas wyszukiwania: 0,03s Redukuj rezultaty
  1. 1
    Optical Scattering: Measurement and Analysis, 2nd Ed
    od Stover, John C.
    Wydane 2009
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on SPIE Digital Library
    Off-campus access
    Elektroniczne E-book
  2. 2
    Optical Scattering: Measurement and Analysis, 3rd Ed
    od Stover, John C.
    Wydane 2012
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on SPIE Digital Library
    Off-campus access
    Elektroniczne E-book
  3. 3
    Optical Scattering: Measurement and Analysis, 2nd Ed
    od Stover, John C.
    On-Campus Access Only (IP based access)
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  4. 4
    Optical Scattering: Measurement and Analysis, 3rd Ed
    od Stover, John C.
    On-Campus Access Only (IP based access)
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  5. 5
    Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  6. 6
    Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  7. 7
    Optical Scattering: Applications, Measurement, and Theory II
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  8. 8
    Optical Scatter: Applications, Measurement, and Theory
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  9. 9
    Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  10. 10
    Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
  11. 11
    Scatter from Optical Components
    On-Campus Access Only (IP based access)
    Kolejni autorzy: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroniczne Książka
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