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  1. 1
    Repeat Performances
    por Stover
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on Project MUSE [7/18/16]
    Off-campus access
    Recurso Eletrônico livro eletrônico
  2. 2
    Optical Scattering: Measurement and Analysis, 2nd Ed
    por Stover, John C.
    Publicado em 2009
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on SPIE Digital Library
    Off-campus access
    Recurso Eletrônico livro eletrônico
  3. 3
    Optical Scattering: Measurement and Analysis, 3rd Ed
    por Stover, John C.
    Publicado em 2012
    Off-Campus Access: Athens ID and Password Required
    On-Campus Access: No User ID or Password Required
    Full text available on SPIE Digital Library
    Off-campus access
    Recurso Eletrônico livro eletrônico
  4. 4
    Optical Scattering: Measurement and Analysis, 2nd Ed
    por Stover, John C.
    On-Campus Access Only (IP based access)
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  5. 5
    Optical Scattering: Measurement and Analysis, 3rd Ed
    por Stover, John C.
    On-Campus Access Only (IP based access)
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  6. 6
    Optical Microlithography IV
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  7. 7
    Optical Microlithography I: Technology for the Mid-1980s
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  8. 8
    Optical Microlithography VI
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  9. 9
    Optical Microlithographic Technology for Integrated Circuit Fabrication and Inspection
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  10. 10
    Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  11. 11
    Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  12. 12
    Optical Microlithography V
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  13. 13
    Optical Microlithography II: Technology for the 1980s
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  14. 14
    Optical Scattering: Applications, Measurement, and Theory II
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  15. 15
    Optical Scatter: Applications, Measurement, and Theory
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  16. 16
    Flatness, Roughness, and Discrete Defect Characterization for Computer Disks, Wafers, and Flat Panel Displays
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  17. 17
    Surface Characterization for Computer Disks, Wafers, and Flat Panel Displays
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  18. 18
    Scatter from Optical Components
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, John…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  19. 19
    Optical Microlithography III: Technology for the Next Decade
    On-Campus Access Only (IP based access)
    Outros Autores: “…Stover, Harry…”
    Full text available on Research4Life (SPIE Digital Library)
    Recurso Eletrônico Livro
  20. 20
    Academic challenges in reading /
    por Abdulaziz, Helen Taylor
    Publicado em 1989
    Includes index.
    Outros Autores: “…Stover, Alfred D., 1948-…”
    Livro
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