Näytetään 1 - 6 yhteensä 6 tuloksesta haulle 'Tobin, Kenneth', hakuaika: 0,01s Tarkenna hakua
  1. 1
    Metrology-based Control for Micro-Manufacturing
    On-Campus Access Only (IP based access)
    Muut tekijät: “…Tobin, Kenneth…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroninen Kirja
  2. 2
    Process and Materials Characterization and Diagnostics in IC Manufacturing
    On-Campus Access Only (IP based access)
    Muut tekijät: “…Tobin, Kenneth…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroninen Kirja
  3. 3
    Data Analysis and Modeling for Process Control
    On-Campus Access Only (IP based access)
    Muut tekijät: “…Tobin, Kenneth…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroninen Kirja
  4. 4
    Machine Vision Applications in Industrial Inspection VIII
    On-Campus Access Only (IP based access)
    Muut tekijät: “…Tobin, Kenneth…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroninen Kirja
  5. 5
    Machine Vision Applications in Industrial Inspection VII
    On-Campus Access Only (IP based access)
    Muut tekijät: “…Tobin, Kenneth…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroninen Kirja
  6. 6
    Sixth International Conference on Quality Control by Artificial Vision
    On-Campus Access Only (IP based access)
    Muut tekijät: “…Tobin, Kenneth…”
    Full text available on Research4Life (SPIE Digital Library)
    Elektroninen Kirja
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