2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH) (IEEE)
Off-Campus Access: Athens ID and Password Required
On-Campus Access: No User ID or Password Required
Mode of access: Internet
Keywords: Power, Energy and Industry Applications; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Signal Processing and Analysis; Conference papers and proceedings