Postek, M. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
Chicago Style (17th ed.) CitationPostek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
MLA (8th ed.) CitationPostek, Michael. Integrated Circuit Metrology, Inspection, and Process Control VI. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.