Lowell, J. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Chicago Style (17th ed.) CitationLowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
MLA (8th ed.) CitationLowell, John. Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing II. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.