Qian, S. 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics. SPIE Digital Library.
Chicago Style (17th ed.) CitationQian, Shinan. 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics. SPIE Digital Library.
MLA (8th ed.) CitationQian, Shinan. 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.