APA (7th ed.) Citation

Postek, M. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. SPIE Digital Library.

Chicago Style (17th ed.) Citation

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. SPIE Digital Library.

MLA (8th ed.) Citation

Postek, Michael. Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V. SPIE Digital Library.

Warning: These citations may not always be 100% accurate.