Stover, J. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Chicago Style (17th ed.) CitationStover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
MLA (8th ed.) CitationStover, John. Flatness, Roughness, and Discrete Defects Characterization for Computer Disks, Wafers, and Flat Panel Displays II. SPIE Digital Library.
Warning: These citations may not always be 100% accurate.