Ajuria, S. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
Παραπομπή σε μορφή Chicago (17η εκδ.)Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
Παραπομπή σε μορφή MLA (8th εκδ.)Ajuria, Sergio. In-Line Characterization Techniques for Performance and Yield Enhancement in Microelectronic Manufacturing II. SPIE Digital Library.
Πρόσοχή: Οι παραπομπές μπορεί να μην είναι 100% ακριβείς.