Introduction to Metrology Applications in IC Manufacturing

Bibliographic Details
Main Author: Su, Bo
Format: Electronic eBook
Language:English
Published: SPIE, 2015
Subjects:
Online Access:Full text available on SPIE Digital Library
Off-campus access
Description
Item Description:<strong>Off-Campus Access:</strong> Athens ID and Password Required
<strong>On-Campus Access:</strong> No User ID or Password Required
Physical Description:1 online resource
Format:Mode of access: Internet
ISBN:9781628416626
9781628418118
DOI:10.1117/3.2197207
Access:Electronic access restricted to authorized BRAC University faculty, staff and students