2018 IEEE/ACM 3rd International Workshop on Metamorphic Testing (MET)
| Fformat: | Electronig Llyfr |
|---|---|
| Iaith: | English |
| Cyhoeddwyd: |
IEEE
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| Pynciau: | |
| Mynediad Ar-lein: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |