2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)
| Materialtyp: | Elektronisk Bok |
|---|---|
| Språk: | English |
| Publicerad: |
IEEE
|
| Ämnen: | |
| Länkar: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |