2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

2022 IEEE International Conference on Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE)

Xehetasun bibliografikoak
Formatua: Baliabide elektronikoa Liburua
Hizkuntza:English
Argitaratua: IEEE
Gaiak:
Bioengineering; Components, Circuits, Devices and Systems; Computing and Processing; General Topics for Engineers; Photonics and Electrooptics; Robotics and Control Systems; Signal Processing and Analysis
Conference papers and proceedings.
Sarrera elektronikoa:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

Internet

Full text available on IEEE [2017-2023]
Off-campus access

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