2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)

2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH)

Bibliografiset tiedot
Aineistotyyppi: Elektroninen Kirja
Kieli:English
Julkaistu: IEEE
Aiheet:
Power, Energy and Industry Applications; Communication, Networking and Broadcast Technologies; Components, Circuits, Devices and Systems; Engineered Materials, Dielectrics and Plasmas; Signal Processing and Analysis
Conference papers and proceedings.
Linkit:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

Internet

Full text available on IEEE [2017-2023]
Off-campus access

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