Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on

Metrology for Extended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), IEEE International Conference on

Opis bibliograficzny
Format: Elektroniczne Książka
Język:English
Wydane: IEEE
Hasła przedmiotowe:
Bioengineering; Components, Circuits, Devices and Systems; Computing and Processing; General Topics for Engineers; Photonics and Electrooptics; Robotics and Control Systems; Signal Processing and Analysis
Conference papers and proceedings.
Dostęp online:Full text available on IEEE [2017-2023]
Off-campus access
Classic Catalogue: View this record in Classic Catalogue

Internet

Full text available on IEEE [2017-2023]
Off-campus access

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