VLSI Test Symposium
| Aineistotyyppi: | Elektroninen Kirja |
|---|---|
| Kieli: | English |
| Julkaistu: |
IEEE
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| Aiheet: | |
| Linkit: | Full text available on IEEE [2017-2023] Off-campus access |
| Classic Catalogue: | View this record in Classic Catalogue |
| Huomautukset: | <strong>Off-Campus Access:</strong> Athens ID and Password Required <strong>On-Campus Access:</strong> No User ID or Password Required |
|---|---|
| Ulkoasu: | 1 online resource |
| Aineistotyyppi: | Mode of access: Internet |
| ISBN: | 1093-0167 2375-1053 |
| Pääsy: | Electronic access restricted to authorized BRAC University faculty, staff and students |