2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)

2013 International Symposium onVLSI Design, Automation, and Test (VLSI-DAT)

Bibliografische gegevens
Formaat:	Elektronisch Boek
Taal:	English
Gepubliceerd in:	IEEE
Onderwerpen:	Computing and Processing; Components, Circuits, Devices and Systems Conference papers and proceedings.
Online toegang:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

Gelijkaardige items

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Gepubliceerd in: (2013)

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