2017 33rd Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

Bibliografische gegevens
Formaat:	Elektronisch Boek
Taal:	English
Gepubliceerd in:	IEEE
Onderwerpen:	Aerospace; Components, Circuits, Devices and Systems; Computing and Processing; Engineered Materials, Dielectrics and Plasmas; Power, Energy and Industry Applications; Signal Processing and Analysis Conference papers and proceedings.
Online toegang:	Full text available on IEEE [2017-2023] Off-campus access
Classic Catalogue:	View this record in Classic Catalogue

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