Proceedings of the ACM SIGMETRICS international conference on Measurement and modeling of computer systems

Proceedings of the ACM SIGMETRICS international conference on Measurement and modeling of computer systems

Detalles Bibliográficos
Formato:	Electrónico Libro
Idioma:	English
Publicado:	Association for Computing Machinery (ACM), 6/14/10
Subjects:	Conference papers and proceedings.
Acceso en liña:	Full text available on Research4Life (ACM)
Classic Catalogue:	View this record in Classic Catalogue

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