8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
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| Format: | Electronic Book |
| Language: | English |
| Published: |
SPIE Digital Library,
1/1/16
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| Online Access: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |