Second International Conference on Testing Technology and Automation Engineering (TTAE 2022)
| Beste egile batzuk: | |
|---|---|
| Formatua: | Baliabide elektronikoa Liburua |
| Hizkuntza: | English |
| Argitaratua: |
SPIE Digital Library,
1/1/65
|
| Gaiak: | |
| Sarrera elektronikoa: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |