Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
| المؤلف الرئيسي: | Shahriar, Selim M. |
|---|---|
| التنسيق: | الكتروني كتاب |
| اللغة: | English |
| منشور في: |
SPIE Digital Library,
1/1/19
|
| الموضوعات: | |
| الوصول للمادة أونلاين: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
مواد مشابهة
- Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
- Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology II
- Steep Dispersion Engineering and Opto-Atomic Precision Metrology XI
- Slow Light, Fast Light, and Opto-Atomic Precision Metrology VIII
- Slow Light, Fast Light, and Opto-Atomic Precision Metrology X