Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
| מחברים אחרים: | Postek, Michael |
|---|---|
| פורמט: | אלקטרוני ספר |
| שפה: | English |
| יצא לאור: |
SPIE Digital Library,
6/9/11
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| נושאים: | |
| גישה מקוונת: | Full text available on Research4Life (SPIE Digital Library) |
| Classic Catalogue: | View this record in Classic Catalogue |
פריטים דומים
- Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
- Scanning Microscopies 2013: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
- Scanning Microscopies 2015
- Scanning Microscopy 2010
- Scanning Microscopy 2009