Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

Detalles Bibliográficos
Outros autores: Chugui, Yuri
Formato: Electrónico Libro
Idioma:English
Publicado: SPIE Digital Library, 7/29/02
Subjects:
Acceso en liña:Full text available on Research4Life (SPIE Digital Library)
Classic Catalogue: View this record in Classic Catalogue

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